Aggregation at a surface: Crossover behaviour in a biased diffusion model

Aggregation at a surface: Crossover behaviour in a biased diffusion model

Publication Type:

Journal Article

Authors:

Kapral, R.; Whittington, S.G.; Desai, C.

Source:

Journal of Physics A: Mathematical and General, Volume 19, Number 9, p.1727-1734 (1986)

URL:

https://www.scopus.com/inward/record.uri?eid=2-s2.0-5544300439&doi=10.1088%2f0305-4470%2f19%2f9%2f043&partnerID=40&md5=420f8604fae55aa232b8ece135457050

Abstract:

The authors introduce a biased diffusion model of aggregation at a surface, which reduces to a ballistic model in one limit. They characterise the structure of the aggregates by a variety of properties and find that it is a strong function of the parameter governing the diffusion process. For thin films there is a crossover between a regime where there are several highly ramified pseudo-one-dimensional clusters and another regime where there is a single cluster which spans the lattice in both directions.